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BibTeX record conf/drc/ThirumalaG18
@inproceedings{DBLP:conf/drc/ThirumalaG18, author = {Sandeep Krishna Thirumala and Sumeet Kumar Gupta}, title = {Gate Leakage in Non-Volatile Ferroelectric Transistors: Device-Circuit Implications}, booktitle = {76th Device Research Conference, {DRC} 2018, Santa Barbara, CA, USA, June 24-27, 2018}, pages = {1--2}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/DRC.2018.8442186}, doi = {10.1109/DRC.2018.8442186}, timestamp = {Wed, 25 Aug 2021 16:24:45 +0200}, biburl = {https://dblp.org/rec/conf/drc/ThirumalaG18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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