BibTeX record conf/drc/ThirumalaG18

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@inproceedings{DBLP:conf/drc/ThirumalaG18,
  author       = {Sandeep Krishna Thirumala and
                  Sumeet Kumar Gupta},
  title        = {Gate Leakage in Non-Volatile Ferroelectric Transistors: Device-Circuit
                  Implications},
  booktitle    = {76th Device Research Conference, {DRC} 2018, Santa Barbara, CA, USA,
                  June 24-27, 2018},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/DRC.2018.8442186},
  doi          = {10.1109/DRC.2018.8442186},
  timestamp    = {Wed, 25 Aug 2021 16:24:45 +0200},
  biburl       = {https://dblp.org/rec/conf/drc/ThirumalaG18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}