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BibTeX record conf/drc/NoyceDF18
@inproceedings{DBLP:conf/drc/NoyceDF18, author = {Steven G. Noyce and James L. Doherty and Aaron D. Franklin}, title = {Bias Stress Stability of Carbon Nanotube Transistors with Implications for Sensors}, booktitle = {76th Device Research Conference, {DRC} 2018, Santa Barbara, CA, USA, June 24-27, 2018}, pages = {1--2}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/DRC.2018.8442226}, doi = {10.1109/DRC.2018.8442226}, timestamp = {Mon, 09 Aug 2021 01:32:18 +0200}, biburl = {https://dblp.org/rec/conf/drc/NoyceDF18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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