BibTeX record conf/drc/HoangDWKKQISWP22

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@inproceedings{DBLP:conf/drc/HoangDWKKQISWP22,
  author       = {Lauren Hoang and
                  Alwin Daus and
                  Sumaiya Wahid and
                  Jimin Kwon and
                  Jung{-}Soo Ko and
                  Shengjun Qin and
                  Mahnaz Islam and
                  Krishna C. Saraswat and
                  H.{-}S. Philip Wong and
                  Eric Pop},
  title        = {Bias Stress Stability of {ITO} Transistors and its Dependence on Dielectric
                  Properties},
  booktitle    = {Device Research Conference, {DRC} 2022, Columbus, OH, USA, June 26-29,
                  2022},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/DRC55272.2022.9855789},
  doi          = {10.1109/DRC55272.2022.9855789},
  timestamp    = {Sun, 12 Nov 2023 02:14:57 +0100},
  biburl       = {https://dblp.org/rec/conf/drc/HoangDWKKQISWP22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}