BibTeX
@inproceedings{DBLP:conf/dft/ZhaoDHM03,
author = {Tianxu Zhao and
Xuchao Duan and
Yue Hao and
Peijun Ma},
title = {Reliability Estimation Model of ICs Interconnect Based on
Uniform Distribution of Defects on a Chip},
booktitle = {DFT},
year = {2003},
pages = {11-17},
ee = {http://csdl.computer.org/comp/proceedings/dft/2003/2042/00/20420011abs.htm},
crossref = {DBLP:conf/dft/2003},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2003,
title = {18th IEEE International Symposium on Defect and Fault-Tolerance
in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA,
USA, Proceedings},
booktitle = {DFT},
publisher = {IEEE Computer Society},
year = {2003},
isbn = {0-7695-2042-1},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2004-07-29 by Michael Ley (ley@uni-trier.de)