BibTeX record conf/dft/YotsuyanagiHIIT01

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@inproceedings{DBLP:conf/dft/YotsuyanagiHIIT01,
  author       = {Hiroyuki Yotsuyanagi and
                  Masaki Hashizume and
                  Taisuke Iwakiri and
                  Masahiro Ichimiya and
                  Takeomi Tamesada},
  title        = {Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable
                  Electric Field},
  booktitle    = {16th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2001), 24-26 October 2001, San Francisco,
                  CA, USA, Proceedings},
  pages        = {287},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/DFTVS.2001.966781},
  doi          = {10.1109/DFTVS.2001.966781},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/YotsuyanagiHIIT01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}