YoshimuraAM11'

@inproceedings{DBLP:conf/dft/YoshimuraAM11,
  author    = {Masayoshi Yoshimura and
               Yusuke Akamine and
               Yusuke Matsunaga},
  title     = {A Soft Error Tolerance Estimation Method for Sequential
               Circuits},
  booktitle = {DFT},
  year      = {2011},
  pages     = {268-276},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/DFT.2011.22},
  crossref  = {DBLP:conf/dft/2011},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/dft/2011,
  title     = {2011 IEEE International Symposium on Defect and Fault Tolerance
               in VLSI and Nanotechnology Systems, DFT 2011, Vancouver,
               BC, Canada, October 3-5, 2011},
  booktitle = {DFT},
  publisher = {IEEE},
  year      = {2011},
  isbn      = {978-1-4577-1713-0},
  ee        = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6104273},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}