DBLP Record 'conf/dft/YiK08'

BibTeX

@inproceedings{DBLP:conf/dft/YiK08,
  author    = {Hyunbean Yi and
               Sandip Kundu},
  title     = {Core Test Wrapper Design to Reduce Test Application Time
               for Modular SoC Testing},
  booktitle = {DFT},
  year      = {2008},
  pages     = {412-420},
  ee        = {http://dx.doi.org/10.1109/DFT.2008.48},
  crossref  = {DBLP:conf/dft/2008},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/dft/2008,
  editor    = {Cristiana Bolchini and
               Yong-Bin Kim and
               Dimitris Gizopoulos and
               Mohammad Tehranipoor},
  title     = {23rd IEEE International Symposium on Defect and Fault-Tolerance
               in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA,
               USA},
  booktitle = {DFT},
  publisher = {IEEE Computer Society},
  year      = {2008},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}