BibTeX
@inproceedings{DBLP:conf/dft/WuWJSSWHJLHA08,
author = {Shianling Wu and
Laung-Terng Wang and
Zhigang Jiang and
Jiayong Song and
Boryau Sheu and
Xiaoqing Wen and
Michael Hsiao and
James Chien-Mo Li and
Jiun Lang Huang and
Ravi Apte},
title = {On Optimizing Fault Coverage, Pattern Count, and ATPG Run
Time Using a Hybrid Single-Capture Scheme for Testing Scan
Designs},
booktitle = {DFT},
year = {2008},
pages = {143-151},
ee = {http://dx.doi.org/10.1109/DFT.2008.29},
crossref = {DBLP:conf/dft/2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2008,
editor = {Cristiana Bolchini and
Yong-Bin Kim and
Dimitris Gizopoulos and
Mohammad Tehranipoor},
title = {23rd IEEE International Symposium on Defect and Fault-Tolerance
in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA,
USA},
booktitle = {DFT},
publisher = {IEEE Computer Society},
year = {2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2009-02-27 by Michael Ley (ley@uni-trier.de)