BibTeX record conf/dft/WenBPUWK22

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@inproceedings{DBLP:conf/dft/WenBPUWK22,
  author       = {Jianan Wen and
                  Andrea Baroni and
                  Eduardo Perez and
                  Markus Ulbricht and
                  Christian Wenger and
                  Milos Krstic},
  editor       = {Luca Cassano and
                  Sreejit Chakravarty and
                  Alberto Bosio},
  title        = {Evaluating Read Disturb Effect on {RRAM} based {AI} Accelerator with
                  Multilevel States and Input Voltages},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2022, Austin, TX, USA, October 19-21,
                  2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/DFT56152.2022.9962345},
  doi          = {10.1109/DFT56152.2022.9962345},
  timestamp    = {Mon, 05 Feb 2024 20:32:50 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/WenBPUWK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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