BibTeX record conf/dft/VayssadeALL20

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@inproceedings{DBLP:conf/dft/VayssadeALL20,
  author       = {T. Vayssade and
                  Florence Aza{\"{\i}}s and
                  Laurent Latorre and
                  Fran{\c{c}}ois Lefevre},
  editor       = {Luigi Dilillo and
                  Mihalis Psarakis and
                  Taniya Siddiqua},
  title        = {{EVM} measurement of {RF} ZigBee transceivers using standard digital
                  {ATE}},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2020, Frascati, Italy, October 19-21,
                  2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/DFT50435.2020.9250900},
  doi          = {10.1109/DFT50435.2020.9250900},
  timestamp    = {Tue, 17 Nov 2020 14:06:59 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/VayssadeALL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}