BibTeX record conf/dft/VatajeluTDBGPTVWS13

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@inproceedings{DBLP:conf/dft/VatajeluTDBGPTVWS13,
  author       = {Elena I. Vatajelu and
                  Georgios Tsiligiannis and
                  Luigi Dilillo and
                  Alberto Bosio and
                  Patrick Girard and
                  Serge Pravossoudovitch and
                  Aida Todri and
                  Arnaud Virazel and
                  Frederic Wrobel and
                  Fr{\'{e}}d{\'{e}}ric Saign{\'{e}}},
  title        = {On the correlation between Static Noise Margin and Soft Error Rate
                  evaluated for a 40nm {SRAM} cell},
  booktitle    = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
                  NY, USA, October 2-4, 2013},
  pages        = {143--148},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/DFT.2013.6653597},
  doi          = {10.1109/DFT.2013.6653597},
  timestamp    = {Sat, 30 Sep 2023 09:38:54 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/VatajeluTDBGPTVWS13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}