Arman Vassighi Oleg Semenov Manoj Sachdev Ali Keshavarzi Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI. 12-19 2002 conf/dft/2002 DFT http://www.computer.org/proceedings/dft/1831/18310012abs.htm db/conf/dft/dft2002.html#VassighiSSK02