BibTeX record conf/dft/ToyookaWHY23

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@inproceedings{DBLP:conf/dft/ToyookaWHY23,
  author       = {Yudai Toyooka and
                  Haruki Watanabe and
                  Toshinori Hosokawa and
                  Masayoshi Yoshimura},
  editor       = {Luca Cassano and
                  Mihalis Psarakis and
                  Marcello Traiola and
                  Alberto Bosio},
  title        = {An Evaluation of Estimated Field Random Testability for Data Paths
                  at Register Transfer Level Using Status Signal Sequences Based on
                  k-Consecutive State Transitions for Field Testing},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
                  3-5, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/DFT59622.2023.10313570},
  doi          = {10.1109/DFT59622.2023.10313570},
  timestamp    = {Tue, 21 Nov 2023 12:38:06 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ToyookaWHY23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}