BibTeX record conf/dft/ThometPDBARGR21

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@inproceedings{DBLP:conf/dft/ThometPDBARGR21,
  author       = {S{\'{e}}bastien Thomet and
                  Serge De Paoli and
                  Jean{-}Marc Daveau and
                  Val{\'{e}}rie Bertin and
                  Fady Abouzeid and
                  Philippe Roche and
                  Fakhreddine Ghaffari and
                  Olivier Romain},
  editor       = {Luigi Dilillo and
                  Luca Cassano and
                  Athanasios Papadimitriou},
  title        = {{FIRECAP:} Fail-Reason Capturing hardware module for a {RISC-V} based
                  System on a Chip},
  booktitle    = {36th {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
                  October 6-8, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/DFT52944.2021.9568317},
  doi          = {10.1109/DFT52944.2021.9568317},
  timestamp    = {Wed, 07 Dec 2022 23:12:29 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ThometPDBARGR21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}