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BibTeX record conf/dft/ThometPDBARGR21
@inproceedings{DBLP:conf/dft/ThometPDBARGR21, author = {S{\'{e}}bastien Thomet and Serge De Paoli and Jean{-}Marc Daveau and Val{\'{e}}rie Bertin and Fady Abouzeid and Philippe Roche and Fakhreddine Ghaffari and Olivier Romain}, editor = {Luigi Dilillo and Luca Cassano and Athanasios Papadimitriou}, title = {{FIRECAP:} Fail-Reason Capturing hardware module for a {RISC-V} based System on a Chip}, booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece, October 6-8, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/DFT52944.2021.9568317}, doi = {10.1109/DFT52944.2021.9568317}, timestamp = {Wed, 07 Dec 2022 23:12:29 +0100}, biburl = {https://dblp.org/rec/conf/dft/ThometPDBARGR21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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