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BibTeX record conf/dft/TaylorEM93
@inproceedings{DBLP:conf/dft/TaylorEM93, author = {D. Taylor and P. S. A. Evans and D. Marland}, editor = {Fabrizio Lombardi and Mariagiovanna Sami and Yvon Savaria and Renato Stefanelli}, title = {Functional Testing of Linear Circuits Using Transient Response Analysis}, booktitle = {The {IEEE} International Workshop on Defect and Fault Tolerance in {VLSI} Systems, October 27-29, 1993, Venice, Italy, Proceedings}, pages = {295--302}, publisher = {{IEEE} Computer Society}, year = {1993}, timestamp = {Mon, 03 Feb 2003 15:42:56 +0100}, biburl = {https://dblp.org/rec/conf/dft/TaylorEM93.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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