BIST Based Fault Diagnosis Using Ambiguous Test Set.

Hiroshi Takahashi Yasunori Tsugaoka Hidekazu Ayano Yuzo Takamatsu BIST Based Fault Diagnosis Using Ambiguous Test Set. 89-96 2003 conf/dft/2003 DFT http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250099 db/conf/dft/dft2003.html#TakahashiTAT03