BibTeX record conf/dft/TakahashiTAT03

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@inproceedings{DBLP:conf/dft/TakahashiTAT03,
  author       = {Hiroshi Takahashi and
                  Yasunori Tsugaoka and
                  Hidekazu Ayano and
                  Yuzo Takamatsu},
  title        = {{BIST} Based Fault Diagnosis Using Ambiguous Test Set},
  booktitle    = {18th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2003), 3-5 November 2003, Boston, MA, USA,
                  Proceedings},
  pages        = {89--96},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/DFTVS.2003.1250099},
  doi          = {10.1109/DFTVS.2003.1250099},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/TakahashiTAT03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}