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BibTeX record conf/dft/TakahashiHKATYH07
@inproceedings{DBLP:conf/dft/TakahashiHKATYH07, author = {Hiroshi Takahashi and Yoshinobu Higami and Toru Kikkawa and Takashi Aikyo and Yuzo Takamatsu and Hiroyuki Yotsuyanagi and Masaki Hashizume}, editor = {Cristiana Bolchini and Yong{-}Bin Kim and Adelio Salsano and Nur A. Touba}, title = {Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines}, booktitle = {22nd {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2007), 26-28 September 2007, Rome, Italy}, pages = {243--251}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/DFT.2007.11}, doi = {10.1109/DFT.2007.11}, timestamp = {Fri, 24 Mar 2023 00:02:09 +0100}, biburl = {https://dblp.org/rec/conf/dft/TakahashiHKATYH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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