BibTeX record conf/dft/SioASC22

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@inproceedings{DBLP:conf/dft/SioASC22,
  author       = {Corrado De Sio and
                  Sarah Azimi and
                  Luca Sterpone and
                  David Merodio Codinachs},
  editor       = {Luca Cassano and
                  Sreejit Chakravarty and
                  Alberto Bosio},
  title        = {Analysis of Proton-induced Single Event Effect in the On-Chip Memory
                  of Embedded Process},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2022, Austin, TX, USA, October 19-21,
                  2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/DFT56152.2022.9962341},
  doi          = {10.1109/DFT56152.2022.9962341},
  timestamp    = {Thu, 08 Dec 2022 15:05:28 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/SioASC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}