@inproceedings{DBLP:conf/dft/SemiaoRVSTT07,
author = {Jorge Semi{\~a}o and
Juan J. Rodr\'{\i}guez-Andina and
Fabian Vargas and
Marcelino Bicho Dos Santos and
Isabel C. Teixeira and
Jo{\~a}o Paulo Teixeira},
title = {Improving the Tolerance of Pipeline Based Circuits to Power
Supply or Temperature Variations},
booktitle = {DFT},
year = {2007},
pages = {303-311},
ee = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.60},
crossref = {DBLP:conf/dft/2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2007,
editor = {Cristiana Bolchini and
Yong-Bin Kim and
Adelio Salsano and
Nur A. Touba},
title = {22nd IEEE International Symposium on Defect and Fault-Tolerance
in VLSI Systems (DFT 2007), 26-28 September 2007, Rome,
Italy},
booktitle = {DFT},
publisher = {IEEE Computer Society},
year = {2007},
isbn = {0-7695-2885-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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