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BibTeX record conf/dft/RuanNI08
@inproceedings{DBLP:conf/dft/RuanNI08, author = {Shuangyu Ruan and Kazuteru Namba and Hideo Ito}, editor = {Cristiana Bolchini and Yong{-}Bin Kim and Dimitris Gizopoulos and Mohammad Tehranipoor}, title = {Soft Error Hardened {FF} Capable of Detecting Wide Error Pulse}, booktitle = {23rd {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2008), 1-3 October 2008, Boston, MA, {USA}}, pages = {272--280}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/DFT.2008.22}, doi = {10.1109/DFT.2008.22}, timestamp = {Fri, 24 Mar 2023 00:02:09 +0100}, biburl = {https://dblp.org/rec/conf/dft/RuanNI08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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