BibTeX record conf/dft/Riley99

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@inproceedings{DBLP:conf/dft/Riley99,
  author       = {Stuart L. Riley},
  title        = {Limitations to Estimating Yield Based on In-Line Defect Measurements},
  booktitle    = {14th International Symposium on Defect and Fault-Tolerance in {VLSI}
                  Systems {(DFT} '99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings},
  pages        = {46--54},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/DFTVS.1999.802868},
  doi          = {10.1109/DFTVS.1999.802868},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/Riley99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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