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BibTeX record conf/dft/Pomeranz22
@inproceedings{DBLP:conf/dft/Pomeranz22, author = {Irith Pomeranz}, editor = {Luca Cassano and Sreejit Chakravarty and Alberto Bosio}, title = {Storage-Based Logic Built-In Self-Test with Variable-Length Test Data}, booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2022, Austin, TX, USA, October 19-21, 2022}, pages = {1--6}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/DFT56152.2022.9962357}, doi = {10.1109/DFT56152.2022.9962357}, timestamp = {Thu, 08 Dec 2022 15:05:28 +0100}, biburl = {https://dblp.org/rec/conf/dft/Pomeranz22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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