BibTeX record conf/dft/PleskaczMH97

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@inproceedings{DBLP:conf/dft/PleskaczMH97,
  author       = {Witold A. Pleskacz and
                  Wojciech Maly and
                  Hans T. Heineken},
  title        = {Detection of Yield Trends},
  booktitle    = {1997 Workshop on Defect and Fault-Tolerance in {VLSI} Systems {(DFT}
                  '97), 20-22 October 1997, Paris, France},
  pages        = {62--68},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/DFTVS.1997.628310},
  doi          = {10.1109/DFTVS.1997.628310},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/PleskaczMH97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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