@inproceedings{DBLP:conf/dft/PleskaczBK02,
author = {Witold A. Pleskacz and
Tomasz Borejko and
Wieslaw Kuzmicz},
title = {CMOS Standard Cells Characterization for IDDQ Testing},
booktitle = {DFT},
year = {2002},
pages = {390-398},
ee = {http://www.computer.org/proceedings/dft/1831/18310390abs.htm},
crossref = {DBLP:conf/dft/2002},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2002,
title = {17th IEEE International Symposium on Defect and Fault-Tolerance
in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver,
BC, Canada, Proceedings},
booktitle = {DFT},
publisher = {IEEE Computer Society},
year = {2002},
isbn = {0-7695-1831-1},
bibsource = {DBLP, http://dblp.uni-trier.de}
}