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BibTeX record conf/dft/OtaHYYA23
@inproceedings{DBLP:conf/dft/OtaHYYA23, author = {Natsuki Ota and Toshinori Hosokawa and Koji Yamazaki and Yukari Yamauchi and Masayuki Arai}, editor = {Luca Cassano and Mihalis Psarakis and Marcello Traiola and Alberto Bosio}, title = {An Estimation Method of Defect Types Using Artificial Neural Networks and Fault Detection Information}, booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October 3-5, 2023}, pages = {1--6}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/DFT59622.2023.10313540}, doi = {10.1109/DFT59622.2023.10313540}, timestamp = {Tue, 21 Nov 2023 12:38:06 +0100}, biburl = {https://dblp.org/rec/conf/dft/OtaHYYA23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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