BibTeX record conf/dft/MunshiML98

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@inproceedings{DBLP:conf/dft/MunshiML98,
  author       = {Avinash Munshi and
                  Fred J. Meyer and
                  Fabrizio Lombardi},
  title        = {A New Method for Testing EEPLA's},
  booktitle    = {13th International Symposium on Defect and Fault-Tolerance in {VLSI}
                  Systems {(DFT} '98), 2-4 November 1998, Austin, TX, USA, Proceedings},
  pages        = {146--154},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/DFTVS.1998.732161},
  doi          = {10.1109/DFTVS.1998.732161},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/MunshiML98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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