BibTeX record: conf/dft/MiuraK06

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@inproceedings{DBLP:conf/dft/MiuraK06,
  author    = {Yukiya Miura and
               Jiro Kato},
  title     = {Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output
               Characteristics},
  booktitle = {21th {IEEE} International Symposium on Defect and Fault-Tolerance
               in {VLSI} Systems {(DFT} 2006), 4-6 October 2006, Arlington, Virginia,
               {USA}},
  year      = {2006},
  pages     = {410--418},
  crossref  = {DBLP:conf/dft/2006},
  url       = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.30},
  doi       = {10.1109/DFT.2006.30},
  timestamp = {Sat, 25 Oct 2014 05:03:09 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/dft/MiuraK06},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/dft/2006,
  title     = {21th {IEEE} International Symposium on Defect and Fault-Tolerance
               in {VLSI} Systems {(DFT} 2006), 4-6 October 2006, Arlington, Virginia,
               {USA}},
  year      = {2006},
  publisher = {{IEEE} Computer Society},
  isbn      = {0-7695-2706-X},
  timestamp = {Sat, 25 Oct 2014 05:03:09 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/dft/2006},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}