@inproceedings{DBLP:conf/dft/MiuraK06,
  author    = {Yukiya Miura and
               Jiro Kato},
  title     = {Fault Diagnosis of Analog Circuits Based on Adaptive Test
               and Output Characteristics},
  booktitle = {DFT},
  year      = {2006},
  pages     = {410-418},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.30},
  crossref  = {DBLP:conf/dft/2006},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/dft/2006,
  title     = {21th IEEE International Symposium on Defect and Fault-Tolerance
               in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington,
               Virginia, USA},
  booktitle = {DFT},
  publisher = {IEEE Computer Society},
  year      = {2006},
  isbn      = {0-7695-2706-X},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}