Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs.

Andrea Manuzzato Paolo Rech Simone Gerardin Alessandro Paccagnella Luca Sterpone Massimo Violante Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. 79-86 2007 DFT http://doi.ieeecomputersociety.org/10.1109/DFT.2007.57 conf/dft/2007 db/conf/dft/dft2007.html#ManuzzatoRGPSV07