BibTeX
@inproceedings{DBLP:conf/dft/ManuzzatoRGPSV07,
author = {Andrea Manuzzato and
Paolo Rech and
Simone Gerardin and
Alessandro Paccagnella and
Luca Sterpone and
Massimo Violante},
title = {Sensitivity Evaluation of TMR-Hardened Circuits to Multiple
SEUs Induced by Alpha Particles in Commercial SRAM-Based
FPGAs},
booktitle = {DFT},
year = {2007},
pages = {79-86},
ee = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.57},
crossref = {DBLP:conf/dft/2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2007,
editor = {Cristiana Bolchini and
Yong-Bin Kim and
Adelio Salsano and
Nur A. Touba},
title = {22nd IEEE International Symposium on Defect and Fault-Tolerance
in VLSI Systems (DFT 2007), 26-28 September 2007, Rome,
Italy},
booktitle = {DFT},
publisher = {IEEE Computer Society},
year = {2007},
isbn = {0-7695-2885-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-09-04 by Michael Ley (ley@uni-trier.de)