BibTeX
@inproceedings{DBLP:conf/dft/LiZL00,
author = {Shengli Li and
Kai Zhang and
Jien-Chung Lo},
title = {The 2nd Order Analysis of IDDQ Test Data},
booktitle = {DFT},
year = {2000},
pages = {376-},
ee = {http://computer.org/proceedings/dft/0719/07190376abs.htm},
crossref = {DBLP:conf/dft/2000},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2000,
title = {15th IEEE International Symposium on Defect and Fault-Tolerance
in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi,
Japan, Proceedings},
booktitle = {DFT},
publisher = {IEEE Computer Society},
year = {2000},
isbn = {0-7695-0719-0},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2003-02-03 by Michael Ley (ley@uni-trier.de)