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DBLP Record 'conf/dft/LiZL00'

BibTeX

@inproceedings{DBLP:conf/dft/LiZL00,
  author    = {Shengli Li and
               Kai Zhang and
               Jien-Chung Lo},
  title     = {The 2nd Order Analysis of IDDQ Test Data},
  booktitle = {DFT},
  year      = {2000},
  pages     = {376-},
  ee        = {http://computer.org/proceedings/dft/0719/07190376abs.htm},
  crossref  = {DBLP:conf/dft/2000},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2000,
  title     = {15th IEEE International Symposium on Defect and Fault-Tolerance
               in VLSI Systems (DFT 2000), 25-27 October 2000, Yamanashi,
               Japan, Proceedings},
  booktitle = {DFT},
  publisher = {IEEE Computer Society},
  year      = {2000},
  isbn      = {0-7695-0719-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2003-02-03 by Michael Ley (ley@uni-trier.de)