BibTeX record conf/dft/LiLM01

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@inproceedings{DBLP:conf/dft/LiLM01,
  author       = {Xiaowei Li and
                  Huawei Li and
                  Yinghua Min},
  title        = {Reducing Power Dissipation during At-Speed Test Application},
  booktitle    = {16th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2001), 24-26 October 2001, San Francisco,
                  CA, USA, Proceedings},
  pages        = {116},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/DFTVS.2001.966760},
  doi          = {10.1109/DFTVS.2001.966760},
  timestamp    = {Thu, 11 May 2023 13:50:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/LiLM01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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