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BibTeX record conf/dft/LiHHTHLMHBWTW10
@inproceedings{DBLP:conf/dft/LiHHTHLMHBWTW10, author = {Tsung{-}Yeh Li and Shi{-}Yu Huang and Hsuan{-}Jung Hsu and Chao{-}Wen Tzeng and Chih{-}Tsun Huang and Jing{-}Jia Liou and Hsi{-}Pin Ma and Po{-}Chiun Huang and Jenn{-}Chyou Bor and Cheng{-}Wen Wu and Ching{-}Cheng Tien and Mike Wang}, title = {AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects}, booktitle = {25th {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} Systems, {DFT} 2010, Kyoto, Japan, October 6-8, 2010}, pages = {340--348}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/DFT.2010.48}, doi = {10.1109/DFT.2010.48}, timestamp = {Sat, 30 Sep 2023 09:38:54 +0200}, biburl = {https://dblp.org/rec/conf/dft/LiHHTHLMHBWTW10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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