BibTeX record conf/dft/LeeWWW05

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@inproceedings{DBLP:conf/dft/LeeWWW05,
  author       = {Leonard Lee and
                  Sean H. Wu and
                  Charles H.{-}P. Wen and
                  Li{-}C. Wang},
  title        = {On Generating Tests to Cover Diverse Worst-Case Timing Corners},
  booktitle    = {20th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2005), 3-5 October 2005, Monterey, CA, {USA}},
  pages        = {415--426},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/DFTVS.2005.50},
  doi          = {10.1109/DFTVS.2005.50},
  timestamp    = {Fri, 24 Mar 2023 00:02:10 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/LeeWWW05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}