Arvind Kumar Sandip Tiwari Testing and Defect Tolerance: A Rent's Rule Based Analysis and Implications on Nanoelectronics. 280-288 2004 conf/dft/2004 DFT http://csdl.computer.org/comp/proceedings/dft/2004/2241/00/22410280abs.htm db/conf/dft/dft2004.html#KumarT04