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BibTeX record conf/dft/KlineLMJ19
@inproceedings{DBLP:conf/dft/KlineLMJ19, author = {Donald Kline Jr. and Stephen Longofono and Rami G. Melhem and Alex K. Jones}, title = {Predicting Single Event Effects in {DRAM}}, booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands, October 2-4, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/DFT.2019.8875328}, doi = {10.1109/DFT.2019.8875328}, timestamp = {Tue, 21 Mar 2023 20:57:35 +0100}, biburl = {https://dblp.org/rec/conf/dft/KlineLMJ19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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