Farzin Karimi Waleed Meleis Zainalabedin Navabi Fabrizio Lombardi Data Compression for System-on-Chip Testing Using ATE. 166-176 2002 conf/dft/2002 DFT http://www.computer.org/proceedings/dft/1831/18310166abs.htm db/conf/dft/dft2002.html#KarimiMNL02