DBLP Record 'conf/dft/KarimiMNL02'

BibTeX

@inproceedings{DBLP:conf/dft/KarimiMNL02,
  author    = {Farzin Karimi and
               Waleed Meleis and
               Zainalabedin Navabi and
               Fabrizio Lombardi},
  title     = {Data Compression for System-on-Chip Testing Using ATE},
  booktitle = {DFT},
  year      = {2002},
  pages     = {166-176},
  ee        = {http://www.computer.org/proceedings/dft/1831/18310166abs.htm},
  crossref  = {DBLP:conf/dft/2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/dft/2002,
  title     = {17th IEEE International Symposium on Defect and Fault-Tolerance
               in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver,
               BC, Canada, Proceedings},
  booktitle = {DFT},
  publisher = {IEEE Computer Society},
  year      = {2002},
  isbn      = {0-7695-1831-1},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}