Xiaohong Jiang Susumu Horiguchi Yue Hao Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core. 30- 2000 conf/dft/2000 DFT http://computer.org/proceedings/dft/0719/07190030abs.htm db/conf/dft/dft2000.html#JiangHH00