IkedaNI07'

@inproceedings{DBLP:conf/dft/IkedaNI07,
  author    = {Takashi Ikeda and
               Kazuteru Namba and
               Hideo Ito},
  title     = {Soft Error Hardened Latch Scheme for Enhanced Scan Based
               Delay Fault Testing},
  booktitle = {DFT},
  year      = {2007},
  pages     = {282-290},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/DFT.2007.44},
  crossref  = {DBLP:conf/dft/2007},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/dft/2007,
  editor    = {Cristiana Bolchini and
               Yong-Bin Kim and
               Adelio Salsano and
               Nur A. Touba},
  title     = {22nd IEEE International Symposium on Defect and Fault-Tolerance
               in VLSI Systems (DFT 2007), 26-28 September 2007, Rome,
               Italy},
  booktitle = {DFT},
  publisher = {IEEE Computer Society},
  year      = {2007},
  isbn      = {0-7695-2885-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}