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BibTeX record conf/dft/HuangCL06
@inproceedings{DBLP:conf/dft/HuangCL06, author = {Yu{-}Jen Huang and Da{-}Ming Chang and Jin{-}Fu Li}, title = {A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy}, booktitle = {21th {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2006), 4-6 October 2006, Arlington, Virginia, {USA}}, pages = {362--370}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/DFT.2006.6}, doi = {10.1109/DFT.2006.6}, timestamp = {Tue, 17 Oct 2023 15:22:33 +0200}, biburl = {https://dblp.org/rec/conf/dft/HuangCL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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