HsingWWHW04'

@inproceedings{DBLP:conf/dft/HsingWWHW04,
  author    = {Yu-Tsao Hsing and
               Chih-Wea Wang and
               Ching-Wei Wu and
               Chih-Tsun Huang and
               Cheng-Wen Wu},
  title     = {Failure Factor Based Yield Enhancement for SRAM Designs},
  booktitle = {DFT},
  year      = {2004},
  pages     = {20-28},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/DFT.2004.29},
  crossref  = {DBLP:conf/dft/2004},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/dft/2004,
  title     = {19th IEEE International Symposium on Defect and Fault-Tolerance
               in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes,
               France, Proceedings},
  booktitle = {DFT},
  publisher = {IEEE Computer Society},
  year      = {2004},
  isbn      = {0-7695-2241-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}