BibTeX record conf/dft/Heidel06

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@inproceedings{DBLP:conf/dft/Heidel06,
  author       = {David F. Heidel},
  title        = {Single-Event-Upset Trends in Advanced {CMOS} Technologies},
  booktitle    = {21th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2006), 4-6 October 2006, Arlington, Virginia,
                  {USA}},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  timestamp    = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/Heidel06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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