Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies.

Michelle L. La Haye Cory Jung David Chen Glenn H. Chapman Jozsef Dudas Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron Technologies. 448-456 2006 conf/dft/2006 DFT http://doi.ieeecomputersociety.org/10.1109/DFT.2006.31 db/conf/dft/dft2006.html#HayeJCCD06