BibTeX
@inproceedings{DBLP:conf/dft/HayeJCCD06,
author = {Michelle L. La Haye and
Cory Jung and
David Chen and
Glenn H. Chapman and
Jozsef Dudas},
title = {Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron
Technologies},
booktitle = {DFT},
year = {2006},
pages = {448-456},
ee = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.31},
crossref = {DBLP:conf/dft/2006},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2006,
title = {21th IEEE International Symposium on Defect and Fault-Tolerance
in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington,
Virginia, USA},
booktitle = {DFT},
publisher = {IEEE Computer Society},
year = {2006},
isbn = {0-7695-2706-X},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-01-15 by Michael Ley (ley@uni-trier.de)