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DBLP Record 'conf/dft/HayeJCCD06'

BibTeX

@inproceedings{DBLP:conf/dft/HayeJCCD06,
  author    = {Michelle L. La Haye and
               Cory Jung and
               David Chen and
               Glenn H. Chapman and
               Jozsef Dudas},
  title     = {Fault Tolerant Active Pixel Sensors in 0.18 and 0.35 Micron
               Technologies},
  booktitle = {DFT},
  year      = {2006},
  pages     = {448-456},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.31},
  crossref  = {DBLP:conf/dft/2006},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dft/2006,
  title     = {21th IEEE International Symposium on Defect and Fault-Tolerance
               in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington,
               Virginia, USA},
  booktitle = {DFT},
  publisher = {IEEE Computer Society},
  year      = {2006},
  isbn      = {0-7695-2706-X},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2007-01-15 by Michael Ley (ley@uni-trier.de)