BibTeX record conf/dft/HanHLLC04

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@inproceedings{DBLP:conf/dft/HanHLLC04,
  author       = {Yinhe Han and
                  Yu Hu and
                  Huawei Li and
                  Xiaowei Li and
                  Anshuman Chandra},
  title        = {Response Compaction for Test Time and Test Pins Reduction Based on
                  Advanced Convolutional Codes},
  booktitle    = {19th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2004), 10-13 October 2004, Cannes, France,
                  Proceedings},
  pages        = {298--305},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.ieeecomputersociety.org/10.1109/DFT.2004.54},
  doi          = {10.1109/DFT.2004.54},
  timestamp    = {Tue, 23 May 2023 16:44:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/HanHLLC04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}