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BibTeX record conf/dft/GutierrezTK017
@inproceedings{DBLP:conf/dft/GutierrezTK017, author = {Mauricio D. Gutierrez and Vasileios Tenentes and Tom J. Kazmierski and Daniele Rossi}, title = {Low cost error monitoring for improved maintainability of IoT applications}, booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI} and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom, October 23-25, 2017}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2017}, url = {https://doi.org/10.1109/DFT.2017.8244445}, doi = {10.1109/DFT.2017.8244445}, timestamp = {Sun, 04 Aug 2024 19:42:52 +0200}, biburl = {https://dblp.org/rec/conf/dft/GutierrezTK017.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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