BibTeX record conf/dft/GoncalvesSTT02

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@inproceedings{DBLP:conf/dft/GoncalvesSTT02,
  author       = {Fernando M. Gon{\c{c}}alves and
                  Marcelino B. Santos and
                  Isabel C. Teixeira and
                  Jo{\~{a}}o Paulo Teixeira},
  title        = {Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling},
  booktitle    = {17th {IEEE} International Symposium on Defect and Fault-Tolerance
                  in {VLSI} Systems {(DFT} 2002), 6-8 November 2002, Vancouver, BC,
                  Canada, Proceedings},
  pages        = {216--224},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/DFTVS.2002.1173518},
  doi          = {10.1109/DFTVS.2002.1173518},
  timestamp    = {Fri, 24 Mar 2023 00:02:09 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/GoncalvesSTT02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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