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BibTeX record conf/dft/GhoshBR03
@inproceedings{DBLP:conf/dft/GhoshBR03, author = {Debjyoti Ghosh and Swarup Bhunia and Kaushik Roy}, title = {Multiple Scan Chain Design Technique for Power Reduction during Test Application in {BIST}}, booktitle = {18th {IEEE} International Symposium on Defect and Fault-Tolerance in {VLSI} Systems {(DFT} 2003), 3-5 November 2003, Boston, MA, USA, Proceedings}, pages = {191--198}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://doi.org/10.1109/DFTVS.2003.1250112}, doi = {10.1109/DFTVS.2003.1250112}, timestamp = {Fri, 24 Mar 2023 00:02:09 +0100}, biburl = {https://dblp.org/rec/conf/dft/GhoshBR03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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