BibTeX record conf/dft/GaoZWYGLWR20

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@inproceedings{DBLP:conf/dft/GaoZWYGLWR20,
  author       = {Zhen Gao and
                  Han Zhang and
                  Xiaohui Wei and
                  Tong Yan and
                  Kangkang Guo and
                  Wenshuo Li and
                  Yu Wang and
                  Pedro Reviriego},
  editor       = {Luigi Dilillo and
                  Mihalis Psarakis and
                  Taniya Siddiqua},
  title        = {Reliable Classification with Ensemble Convolutional Neural Networks},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2020, Frascati, Italy, October 19-21,
                  2020},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/DFT50435.2020.9250837},
  doi          = {10.1109/DFT50435.2020.9250837},
  timestamp    = {Thu, 21 Jul 2022 15:18:45 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/GaoZWYGLWR20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}